IoT platform fuzzing: lessons learned

Binary Mutation Analysis of Tests Using Reassembleable Disassembly

Navid Emamdoost (University of Minnesota), Vaibhav Sharma (University of Minnesota), Taejoon Byun (University of Minnesota), Stephen McCamant (University of Minnesota)

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CLIK on PLCs! Attacking Control Logic with Decompilation and...

Sushma Kalle (University of New Orleans), Nehal Ameen (University of New Orleans), Hyunguk Yoo (University of New Orleans), Irfan Ahmed (Virginia Commonwealth University)

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Detecting Obfuscated Function Clones in Binaries using Machine Learning

Michael Pucher (University of Vienna), Christian Kudera (SBA Research), Georg Merzdovnik (SBA Research)

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The State of Firmware Analysis (And What We're Doing...

Eric Gustafson (UC Santa Barbara)

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