Johnathan Wilkes, John Anny (Palo Alto Networks)

By embracing automation, organizations can transcend manual limitations to reduce mean time to response and address exposures consistently across their cybersecurity infrastructure. In the dynamic realm of cybersecurity, swiftly addressing externally discovered exposures is paramount, as each represents a ticking time bomb. A paradigm shift towards automation to enhance speed, efficiency, and uniformity in the remediation process is needed to answer the question, "You found the exposure, now what?". Traditional manual approaches are not only time-consuming but also prone to human error, underscoring the need for a comprehensive, automated solution. Acknowledging the diversity of exposures and the array of security tools, we will propose how to remediate common external exposures, such as open ports and dangling domains. The transformative nature of this shift is crucial, particularly in the context of multiple cloud platforms with distinct data enrichment and remediation capabilities.

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TEE-SHirT: Scalable Leakage-Free Cache Hierarchies for TEEs

Kerem Arikan (Binghamton University), Abraham Farrell (Binghamton University), Williams Zhang Cen (Binghamton University), Jack McMahon (Binghamton University), Barry Williams (Binghamton University), Yu David Liu (Binghamton University), Nael Abu-Ghazaleh (University of California, Riverside), Dmitry Ponomarev (Binghamton University)

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Attributions for ML-based ICS Anomaly Detection: From Theory to...

Clement Fung (Carnegie Mellon University), Eric Zeng (Carnegie Mellon University), Lujo Bauer (Carnegie Mellon University)

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MPCDiff: Testing and Repairing MPC-Hardened Deep Learning Models

Qi Pang (Carnegie Mellon University), Yuanyuan Yuan (HKUST), Shuai Wang (HKUST)

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Detecting Voice Cloning Attacks via Timbre Watermarking

Chang Liu (University of Science and Technology of China), Jie Zhang (Nanyang Technological University), Tianwei Zhang (Nanyang Technological University), Xi Yang (University of Science and Technology of China), Weiming Zhang (University of Science and Technology of China), NengHai Yu (University of Science and Technology of China)

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