Abdullah Zubair Mohammed (Virginia Tech), Yanmao Man (University of Arizona), Ryan Gerdes (Virginia Tech), Ming Li (University of Arizona) and Z. Berkay Celik (Purdue University)

The Controller Area Network (CAN) bus standard is the most common in-vehicle network that provides communication between Electronic Control Units (ECUs). CAN messages lack authentication and data integrity protection mechanisms and hence are vulnerable to attacks, such as impersonation and data injection, at the digital level. The physical layer of the bus allows for a one-way change of a given bit to accommodate prioritization; viz. a recessive bit (1) may be changed to a dominant one (0). In this paper, we propose a physical-layer data manipulation attack wherein multiple compromised ECUs collude to cause 0→1 (i.e., dominant to recessive) bit-flips, allowing for arbitrary bit-flips in transmitted messages. The attack is carried out by inducing transient voltages in the CAN bus that are heightened due to the parasitic reactance of the bus and non-ideal properties of the line drivers. Simulation results indicate that, with more than eight compromised ECUs, an attacker can induce a sufficient voltage drop to cause dominant bits to be flipped to recessive ones.

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Ziwen Wan (UC Irvine), Junjie Shen (UC Irvine), Jalen Chuang (UC Irvine), Xin Xia (UCLA), Joshua Garcia (UC Irvine), Jiaqi Ma (UCLA) and Qi Alfred Chen (UC Irvine)

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Yijun Yang (The Chinese University of Hong Kong), Ruiyuan Gao (The Chinese University of Hong Kong), Yu Li (The Chinese University of Hong Kong), Qiuxia Lai (Communication University of China), Qiang Xu (The Chinese University of Hong Kong)

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Gen Zhang (National University of Defense Technology), Pengfei Wang (National University of Defense Technology), Tai Yue (National University of Defense Technology), Xiangdong Kong (National University of Defense Technology), Shan Huang (National University of Defense Technology), Xu Zhou (National University of Defense Technology), Kai Lu (National University of Defense Technology)

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Aditya Singh Rathore (University at Buffalo, SUNY), Yijie Shen (Zhejiang University), Chenhan Xu (University at Buffalo, SUNY), Jacob Snyderman (University at Buffalo, SUNY), Jinsong Han (Zhejiang University), Fan Zhang (Zhejiang University), Zhengxiong Li (University of Colorado Denver), Feng Lin (Zhejiang University), Wenyao Xu (University at Buffalo, SUNY), Kui Ren (Zhejiang University)

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