M. Uğur Aksu, Enes Altuncu, Kemal Bicakci (TOBB University of Economics and Technology)
A First Look at the Usability of OpenVAS Vulnerability Scanner
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Youngwook Do (JPMorganChase and Georgia Institute of Technology), Tingyu Cheng (Georgia Institute of Technology and University of Notre Dame), Yuxi Wu (Georgia Institute of Technology and Northeastern University), HyunJoo Oh(Georgia Institute of Technology), Daniel J. Wilson (Northeastern University), Gregory D. Abowd (Northeastern University), Sauvik Das (Carnegie Mellon University)
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Leon Kersten (Eindhoven University of Technology), Kim Beelen (Eindhoven University of Technology), Emmanuele Zambon (Eindhoven University of Technology), Chris Snijders (Eindhoven University of Technology), Luca Allodi (Eindhoven University of Technology)
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June De La Cruz (INSPIRIT Lab, University of Denver), Sanchari Das (INSPIRIT Lab, University of Denver)
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Shujaat Mirza, Christina Pöpper (New York University)
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