Jacopo Corbetta (Qualcomm)
IoT platform fuzzing: lessons learned
View More Papers
Binary Mutation Analysis of Tests Using Reassembleable Disassembly
Navid Emamdoost (University of Minnesota), Vaibhav Sharma (University of Minnesota), Taejoon Byun (University of Minnesota), Stephen McCamant (University of Minnesota)
Read MoreUnlocking the Potential of Domain Aware Binary Analysis in...
Dr. Zhiqiang Lin (Distinguished Professor of Engineering at The Ohio State University)
Read MoreThe Inconvenient Truths of Ground Truth for Binary Analysis
Jim Alves-Foss, Varsha Venugopal (University of Idaho)
Read MoreBeyond the C: Retargetable Decompilation using Neural Machine Translation
Iman Hosseini, Brendan Dolan-Gavitt (NYU)
Read More