Xueyuan Han (Harvard University), Thomas Pasquier (University of Bristol), Adam Bates (University of Illinois at Urbana-Champaign), James Mickens (Harvard University), Margo Seltzer (University of British Columbia)

Advanced Persistent Threats (APTs) are difficult to detect due to their “low-and-slow” attack patterns and frequent use of zero-day exploits. We present UNICORN, an anomaly-based APT detector that effectively leverages data provenance analysis. From modeling to detection, UNICORN tailors its design specifically for the unique characteristics of APTs. Through extensive yet time-efficient graph analysis, UNICORN explores provenance graphs that provide rich contextual and historical information to identify stealthy anomalous activities without pre-defined attack signatures. Using a graph sketching technique, it summarizes long-running system execution with space efficiency to combat slow-acting attacks that take place over a long time span. UNICORN further improves its detection capability using a novel modeling approach to understand long-term behavior as the system evolves. Our evaluation shows that UNICORN outperforms an existing state-of-the-art APT detection system and detects real-life APT scenarios with high accuracy.

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Matthew Smith (University of Oxford), Martin Strohmeier (University of Oxford), Jonathan Harman (Vrije Universiteit Amsterdam), Vincent Lenders (armasuisse Science and Technology), Ivan Martinovic (University of Oxford)

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Soroush Karami (University of Illinois at Chicago), Panagiotis Ilia (University of Illinois at Chicago), Konstantinos Solomos (University of Illinois at Chicago), Jason Polakis (University of Illinois at Chicago)

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Teemu Rytilahti (Ruhr University Bochum), Thorsten Holz (Ruhr University Bochum)

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Qi Wang (University of Illinois Urbana-Champaign), Wajih Ul Hassan (University of Illinois Urbana-Champaign), Ding Li (NEC Laboratories America, Inc.), Kangkook Jee (University of Texas at Dallas), Xiao Yu (NEC Laboratories America, Inc.), Kexuan Zou (University Of Illinois Urbana-Champaign), Junghwan Rhee (NEC Laboratories America, Inc.), Zhengzhang Chen (NEC Laboratories America, Inc.), Wei Cheng (NEC Laboratories America,…

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