Connor Glosner (Purdue University), Aravind Machiry (Purdue University)

Unified Extensible Firmware Interface (UEFI) specification describes a platform-independent pre-boot interface for an Operating System (OS). EDK-2 Vulnerabilities in UEFI interface functions have severe consequences and can lead to Bootkits and other persistent malware resilient to OS reinstallations. However, there exist no vulnerability detection techniques for UEFI interfaces. We present FUZZUER, a feedback-guided fuzzing technique for UEFI interfaces on EDK-2, an exemplary and prevalently used UEFI implementation. We designed FIRNESS that utilizes static analysis techniques to automatically generate fuzzing harnesses for interface functions. We evaluated FUZZUER on the latest version of EDK-2. Our comprehensive evaluation on 150 interface functions demonstrates that FUZZUER with FIRNESS is an effective testing technique of EDK-2’s UEFI interface functions, greatly outperforming HBFA, an existing testing tool with manually written harnesses. We found 20 new security vulnerabilities, and most of these are already acknowledged by the developers.

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Uncovering the iceberg from the tip: Generating API Specifications...

Miaoqian Lin (Institute of Information Engineering, Chinese Academy of Sciences, Beijing, China; School of Cyber Security, University of Chinese Academy of Sciences, China), Kai Chen (Institute of Information Engineering, Chinese Academy of Sciences, Beijing, China; School of Cyber Security, University of Chinese Academy of Sciences, China), Yi Yang (Institute of Information Engineering, Chinese Academy of…

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A Multifaceted Study on the Use of TLS and...

Ka Fun Tang (The Chinese University of Hong Kong), Che Wei Tu (The Chinese University of Hong Kong), Sui Ling Angela Mak (The Chinese University of Hong Kong), Sze Yiu Chau (The Chinese University of Hong Kong)

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Tweezers: A Framework for Security Event Detection via Event...

Jian Cui (Indiana University), Hanna Kim (KAIST), Eugene Jang (S2W Inc.), Dayeon Yim (S2W Inc.), Kicheol Kim (S2W Inc.), Yongjae Lee (S2W Inc.), Jin-Woo Chung (S2W Inc.), Seungwon Shin (KAIST), Xiaojing Liao (Indiana University)

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