Keisuke Nishimura, Yuichi Sugiyama, Yuki Koike, Masaya Motoda, Tomoya Kitagawa, Toshiki Takatera, Yuma Kurogome (Ricerca Security, Inc.)

Fuzzing has contributed to automatically identifying bugs and vulnerabilities in the software testing field. Although it can efficiently generate crashing inputs, these inputs are usually analyzed manually. Several root cause analysis (RCA) techniques have been proposed to automatically analyze the root causes of crashes to mitigate this cost. However, outstanding challenges for realizing more elaborate RCA techniques remain unknown owing to the lack of extensive evaluation methods over existing techniques. With this problem in mind, we developed an end-to-end benchmarking platform, RCABench, that can evaluate RCA techniques for various targeted programs in a detailed and comprehensive manner. Our experiments with RCABench indicated that the evaluations in previous studies were not enough to fully support their claims. Moreover, this platform can be leveraged to evaluate emerging RCA techniques by comparing them with existing techniques.

View More Papers

BARS: Local Robustness Certification for Deep Learning based Traffic...

Kai Wang (Tsinghua University), Zhiliang Wang (Tsinghua University), Dongqi Han (Tsinghua University), Wenqi Chen (Tsinghua University), Jiahai Yang (Tsinghua University), Xingang Shi (Tsinghua University), Xia Yin (Tsinghua University)

Read More

Parakeet: Practical Key Transparency for End-to-End Encrypted Messaging

Harjasleen Malvai (UIUC/IC3), Lefteris Kokoris-Kogias (IST Austria), Alberto Sonnino (Mysten Labs), Esha Ghosh (Microsoft Research), Ercan Oztürk (Meta), Kevin Lewi (Meta), Sean Lawlor (Meta)

Read More

Double and Nothing: Understanding and Detecting Cryptocurrency Giveaway Scams

Xigao Li (Stony Brook University), Anurag Yepuri (Stony Brook University), Nick Nikiforakis (Stony Brook University)

Read More

Trellis: Robust and Scalable Metadata-private Anonymous Broadcast

Simon Langowski (Massachusetts Institute of Technology), Sacha Servan-Schreiber (Massachusetts Institute of Technology), Srinivas Devadas (Massachusetts Institute of Technology)

Read More